Liquid crystal display panel and method for repairing signal line thereof

ABSTRACT

A display panel and a method for repairing signal lines thereof are disclosed. The display panel includes at least one shorting bar, switches, and auxiliary repair lines. The switches are electrically coupled respectively to signal lines and the at least one shorting bar. Both ends of each of the auxiliary repair lines overlap one of connections between the switches and the at least one shorting bar. When a signal line is damaged, the method for repairing includes: breaking off each of the connections between the switches and the at least one shorting bar by cutting; and welding both ends of one of the auxiliary repair lines which correspond to the damaged signal line with both sides of one of the connections which correspond to the damaged signal line.

TECHNICAL FIELD OF THE INVENTION

The present invention relates to a display panel, and especially to aliquid crystal display (LCD) panel and a method for repairing signallines thereof.

BACKGROUND OF THE INVENTION

FIG. 1 is a top view schematically illustrating a repairing of a signalline in a conventional liquid crystal display (LCD) panel. Referring toFIG. 1, the LCD panel includes a substrate 10, which comprises aplurality of scan lines 12 and a plurality of signal lines 14, and thescan lines 12 are parallel to each other and cross the signal lines 14.A plurality of pixel regions and a thin film transistor (TFT) array aredefined between the scan lines 12 and the signal lines 14 (not shown).In addition, the substrate 10 comprises a scan line driver chip 22 and aplurality of signal line driver chips 24, in which only a signal linedriver chip 24 is depicted for clarity. The scan line driver chip 22 isutilized to drive the scan lines 12 in sequence, and the signal linedriver chips 24 are utilized to provide voltage data of the pixels forthe signal lines 14.

As the number of the pixels increases, the intervals between theadjacent scan lines 12 or the adjacent signal lines 14 are only a fewmicrons on the substrate 10. Thus, the signal lines 14 may be broken offdue to foreign bodies (such as dusts) in the manufacturing process. Inorder to overcome the problem of the disconnection of the signal lines14, a repair line 16 is disposed on the substrate 10 for repairing thebroken signal lines in the conventional LCD panel. The repair line 16 isdisposed on the periphery of an active area 11 defined by the scan lines12 and the signal lines 14, in addition, the repair line 16 crosses thesignal lines 14 and separated therewith by an isolation layer. When oneof the signal lines 14 is broken off, the intersection of the repairline 16 and the broken signal line 14 can be welded by laser, and thenthe data provided from the signal line driver chip 24 is transmitted tothe broken signal line 14 via the repair line 16.

However, with an increase of the pixel number, the numbers of scan lines12 and signal lines 14 become tremendous. The scan line driver chip 22and the signal line driver chips 24 occupy most of the substrate 10periphery area, so the available periphery area of the substrate 10becomes smaller and smaller. Therefore, the repair line 16 is difficultto be disposed.

SUMMARY OF THE INVENTION

Accordingly, an objective of the present invention is to provide adisplay panel which the periphery area being occupied can be reduced,thereby overcoming the problems of the above-mentioned prior art.

Another objective of the present invention is to provide a method forrepairing signal lines of the display panel. The signal lines can berepaired by the structure of the display panel without disposing arepair line.

To achieve the foregoing objectives, according to an aspect of thepresent invention, a display panel is provided. In a first preferredembodiment of the present invention, the display panel has a pluralityof signal lines being disposed on a substrate. The display panelincludes at least one shorting bar and a plurality of switches. Theswitches are electrically coupled respectively to the signal lines andthe at least one shorting bar, and each of the switches includes a gatepattern, a source line and a drain line.

The gate pattern is disposed on the substrate. The gate pattern has afirst region and a second region, in which the first region and thesecond region are connected by a connecting portion. The gate patternsof the switches are electrically coupled with each other via the firstregion and the second region thereof. The source line is disposed on thegate pattern, and an insulation layer is disposed between the sourceline and the gate pattern. One end of the source line is electricallycoupled to one of the signal lines. The drain line is disposed on thegate pattern, and the insulation layer is disposed between the drainline and the gate pattern. One end of the drain line is electricallycoupled to the shorting bar.

In the first preferred embodiment of the present invention, the switchesinclude a plurality of thin film transistor (TFT) switches. Moreover,the gate pattern, the source line and the drain line are respectively agate, a source and a drain of the TFT switch.

In the first preferred embodiment of the present invention, the firstregions of the gate patterns of the two adjacent switches areelectrically coupled with each other, and the second regions thereof areelectrically coupled with each other. The source line and the drain lineexpose the connecting portion of the gate pattern. In addition, thesource lines and the drain lines of the switches and the signal linesare made of same metal material, and the shorting bar and the gatepattern of the switches are made of same metal material.

According to another aspect of the present invention, a method forrepairing the signal lines of the display panel in the first preferredembodiment is provided. The method is adapted for repairing a damagedsignal line. The method includes a cutting process and a weldingprocess.

The cutting process is by breaking off the connecting portion of thegate pattern which corresponds to the damaged signal line and separatingthe first region of the gate pattern from adjacent first regions. Thewelding process is by welding the source line and the drain line whichcorrespond to the damaged signal line with the first region of the gatepattern. A signal from the damaged signal line is transmitted to thedamaged signal line via the first region of the gate pattern and thewelded source line.

In the first preferred embodiment, the welding process can beimplemented by a laser welding, and the source line and the drain linepenetrate the insulation layer to electrically couple to the gatepattern in the welding process.

In addition, a display panel is provided in a second preferredembodiment of the present invention. The display panel has a pluralityof signal lines which are disposed on a substrate. The display panelfurther includes at least one shorting bar, a plurality of switches, aplurality of auxiliary repair lines and an insulation layer. Theswitches are electrically coupled respectively to the signal lines andthe at least one shorting bar. Both ends of each of the auxiliary repairlines overlap one of a plurality of connections between the switches andthe at least one shorting bar. The insulation layer is disposed betweenthe auxiliary repair lines and the connections.

In the second preferred embodiment, each of the switches includes a gatepattern, a source line and a drain line. The gate pattern is disposed onthe substrate. The source line is disposed on the gate pattern, and aninsulation layer is disposed between the source line and the gatepattern. One end of the source line is electrically coupled to one ofthe signal lines. The drain line is disposed on the gate pattern, andthe insulation layer is disposed between the drain line and the gatepattern. One end of the drain line is electrically coupled to theshorting bar.

In the second preferred embodiment, the switches include a plurality ofthin film transistor (TFT) switches which are connected in cascadethrough the gates thereof. In addition, the source lines of theswitches, the drain lines and the signal lines are made of same metalmaterial, and the shorting bar, the auxiliary repair lines and the gatepattern of the switches are made of same metal material.

A method for repairing the signal lines of the display panel in thesecond preferred embodiments is provided. The method is adapted forrepairing a damaged signal line. The method includes a cutting processand a welding process.

The cutting process is by breaking off each of the connections betweeneach of the switches and the at least one shorting bar. The weldingprocess is by welding both ends of one of the auxiliary repair lineswhich correspond to the damaged signal line with both sides of one ofthe connections which correspond to the damaged signal line. The weldingprocess can be implemented via a laser welding.

In the second preferred embodiment, a signal from the damaged signalline is transmitted to the damaged signal line via the shorting bar, theauxiliary repair line and the switch which correspond to the damagedsignal line. The switch which corresponds to the damaged signal line isin an on-state.

In accordance with the display panel and the method for repairing thesignal lines thereof, the problem that the repair line needs to bedisposed on the periphery area of the substrate has been solved wherebya circuit route of simplified lighting replacing the repair line,thereby increases the available periphery area of the substrate.

It is to be understood that both the foregoing general description andthe following detailed description of the present invention areexemplary and explanatory and are intended to provide furtherexplanation of the invention as claimed.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a top view schematically illustrating repairing a signal linein a conventional liquid crystal display (LCD) panel;

FIG. 2 is a schematic drawing illustrating the display panel accordingto the first preferred embodiment of the present invention;

FIG. 3 is a schematic drawing illustrating a circuit route of simplifiedlighting according to the first preferred embodiment of the presentinvention;

FIG. 4 is a schematic drawing illustrating a layout design of FIG. 3;

FIG. 5 is a top view illustrating a layout design of the switches in thefirst embodiment of the present invention;

FIG. 6 is a schematic drawing illustrating a circuit route structure forrepairing the signal lines according to the first preferred embodimentof the present invention;

FIG. 7 is a schematic drawing illustrating a circuit route structure forrepairing the signal lines according to the second preferred embodimentof the present invention;

FIG. 8 is a schematic drawing illustrating a circuit of the displaypanel according to the third preferred embodiment of the presentinvention; and

FIG. 9 is a schematic drawing illustrating a circuit of the displaypanel according to the fourth preferred embodiment of the presentinvention.

DETAILED DESCRIPTION OF THE INVENTION

The present invention will now be described in detail with reference toa few preferred embodiments thereof as illustrated in the accompanyingdrawings. The same reference numerals refer to the same parts or likeparts throughout the various Figures. The following will explain adisplay panel according to a first preferred embodiment of the presentinvention in detail with drawings.

FIG. 2 is a schematic drawing illustrating the display panel accordingto the first preferred embodiment of the present invention. Referring toFIG. 2, the display panel includes a substrate 10, a plurality of signallines 14, a plurality of scan lines 12, a scan line driver chip 22, aplurality of signal line driver chip 24, a shorting bar group 30, and aplurality of switches 40. The scan lines 12 are parallel to each otherand cross the signal lines 14, of which the scan lines 12 are disposedon the substrate 10. The scan line driver chip 22 and the signal linedriver chip 24 are disposed on the periphery area of the substrate 10.The scan line driver chip 22 is utilized to driver the scan lines 12 insequence, and the signal line driver chip 24 are utilized to providevoltage data of the pixels for the signal lines 14. Each of the switches40 can be implemented by a thin film transistor (TFT).

FIG. 3 is a schematic drawing illustrating a circuit route of simplifiedlighting according to the first preferred embodiment of the presentinvention, and FIG. 4 is a schematic drawing illustrating a layoutdesign of FIG. 3; namely, FIGS. 3 and 4 illustrate the circuit route ofsimplified lighting in a cell test process. Referring to FIGS. 3 and 4,the circuit route of simplified lighting includes the shorting bar group30 and the switches 40. The shorting bar group 30 is disposed on thesubstrate 10 and includes at least one shorting bar. In the cell testprocess, the shorting bar group 30 is utilized to transmit test signalsto the signal lines 14 for inspecting whether the display panel hasabnormal defects (for example: light, dark spots or an unusual colordisplay). If one of the signal lines 14 is broken, an unusual colordisplay is generated on the color filters which correspond to the brokensignal lines 14. In general, the shorting bar group 30 comprises threeshorting bars, such as a first shorting bar 301, a second shorting bar302 and a third shorting bar 303 for inspecting the signal lines 14 todisplay red, green and blue.

As mentioned above, the switches 40 are a plurality of TFT switcheswhich are connected in cascade through the gates thereof. The switches40 are respectively electrically coupled to the signal lines 14 and thefirst shorting bar 301, the second shorting bar 302 and the thirdshorting bar 303. Both ends of the switches 40 and the shorting bargroup 30 (the first shorting bar 301, the second shorting bar 302, andthe third shorting bar 303) are belong to two different metal layers,and an insulation layer is disposed therebetween (not shown for clarity)for protection. Thus, one end of the switches 40 is electrically coupledto the first shorting bar 301, the second shorting bar 302 and the thirdshorting bar 303 through a bonding pad 38 (Jumper Layer) to penetratethe insulation layer.

Each of the switches (i.e., TFTs) includes a gate pattern 42, a sourceline 44 and a drain line 46. For instance, the gate pattern 42, thesource line 44 and the drain line 46 are respectively a gate, a sourceand a drain of the TFT switches. It should be noted that the gatepatterns 42 of the switches 40 are electrically coupled with each otheras shown in FIG. 4, and the gate patterns 42 are electrically coupled tothe scan line driver chip 22 as shown in FIG. 2. During the cell testprocess, an external inspection apparatus output a high voltage (Vgh)signal to the gate patterns 42 of the switches 40, making the sourcelines 44 and the drain lines 46 of the switches 40 conduct. When theswitches 40 is conducted, the test signals can be transmitted to thesignal lines 14 via the first shorting bar 301, the second shorting bar302 and the third shorting bar 303 for inspection.

FIG. 5 is a top view illustrating a layout design of the switches in thefirst embodiment of the present invention, which is utilized to explainthe detailed structures of the switches 40. Referring to FIG. 5, thegate pattern 42 (designated as 42 a, 42 b and 42 c) is disposed on thesubstrate 10, and the gate pattern 42 has a first region 42 a and asecond region 42 b wherein the first region 42 a and the second region42 b are connected by a connecting portion 42 c. The manner forconnecting the gate pattern 42 a of any two adjacent switches 40 is thatthe first regions 42 a are electrically coupled with each other and thesecond regions 42 b thereof are electrically coupled with each other. Itshould be noted that the source line 44 and the drain line 46 expose theconnecting portion 42 c of the gate pattern 42.

The source line 44 is disposed on the gate pattern 42, and theinsulation layer (not shown) is disposed between the source line 44 andthe gate pattern 42 thereby serving as an insulator between the gate andthe source of the TFT switch. One end of the source line 44 iselectrically coupled to one of the signal lines 14. The drain line 46 isdisposed on the gate pattern 42; also the insulation layer (not shown)is disposed between the drain line 46 and gate pattern 42 therebyserving as an insulator between the gate and the drain of the TFTswitch. One end of the drain line 46 is electrically coupled to theshorting bar group 30. Furthermore, the source line 44 and the drainline 46 are designed as comb shapes to increase a W/L ratio of atransistor (W is designated as a channel width of the transistor, and Lis designated as a channel length of the transistor) for benefiting theconduction of the switch 40.

The source lines 44 of the switches 40, the drain lines 46 and thesignal lines 14 are made of same metal material; for example, they areformed in the same manufacturing process in array process of the LCDpanel. Similarly, the shorting bar group 30 and the gate patterns 42 ofthe switches 40 are made of same metal material; for example, they areformed in the same manufacturing process in array process of the LCDpanel. Therefore, it is not required to increase additionalmanufacturing processes.

The method for repairing the signal lines of the display panel in thefirst preferred embodiment of the present invention will be explained indetail in the following. Referring to FIG. 6, FIG. 6 is a schematicdrawing illustrating a circuit route structure for repairing the signallines according to the first preferred embodiment of the presentinvention. A position of a damaged signal line 14 can be inspected onthe display panel in the first preferred embodiment of the presentinvention after the cell test process. In the first preferredembodiment, the method for repairing the signal lines is aimed at theswitch 40 which corresponds to the damaged signal line 14. The methodfor repairing the signal lines includes a cutting process and a weldingprocess.

The cutting process is by breaking off the connecting portion 42 c ofthe gate pattern 42 and separating the corresponding first region 42 aalong the dotted lines from adjacent first regions. The welding processis welding the source line 44 the drain line 46 which correspond to thedamaged signal line 14 with the first region 42 a of the gate pattern42.

It should be noted that the cutting process is cutting the connectingportion 42 c of the switch 40 which corresponds to the damaged signalline 14, but without cutting off the source line 44 and the drain line46 of the switch 40. In addition, the welding process is only weldingthe source line 44 and the drain line 46 which correspond to the damagedsignal line 14 into the first region 42 a of the gate pattern 42, makingthe source line 44 and the drain line 46 electrically coupling to thefirst region 42 a of the gate pattern 42. The cutting process herein canbe implemented by a laser cutting. The welding process can beimplemented via a laser welding, thereby making the source line 44 andthe drain line 46 penetrate the insulation layer to electrically coupleto the gate pattern 42.

The display signal 23 of the damaged signal line 14 is given off formthe signal line driver chip 24 and transmitted to the damaged signalline 14 through the shorting bar group 30 (refer to FIG. 4), the weldeddrain line 46 (via a welding spot 51 a), the first region 42 a and thewelded source line 44 (via a welding spot 51 b) for repairing thesignal.

As mentioned above, in the display panel of the first preferredembodiment of the present invention, the special structure of theswitches 40 in the circuit route of simplified lighting are designed asthe first regions 42 a and the second regions 42 b. Moreover, theconnecting portions 42 c are uncovered by the source lines 44 and thedrain lines 46, so that the connecting portions 42 c can be broken offduring the process of repairing, and than the source line 44 can bewelded into the first region 42 a for transmitting the display signal23. Therefore, the problem that the repair line needs to be disposed onthe periphery area of the substrate has been solved, and the availableperiphery area of the substrate is also increased.

The following will explain an display panel according to a secondpreferred embodiment of the present invention in detail with drawings.FIG. 7 is a schematic drawing illustrating a circuit route structure forrepairing the signal lines according to the second preferred embodimentof the present invention. Referring to FIGS. 2 and 7, the display panelincludes a substrate 10, a plurality of signal lines 14, a plurality ofscan lines 12, a scan line driver chip 22, a plurality of signal linedriver chip 24, a shorting bar group 30, a plurality of switches 41 anda plurality of auxiliary repair line 62. The descriptions of the sameelements in the display panel of the first preferred embodiment havebeen explained as above mention, so we need not go into detail herein.

The following will explain the switches 41 that is similar to theswitches 40 in the first preferred embodiment. The switches 41 are aplurality of TFT switches which are connected in cascade through thegates thereof. The switches 41 are electrically coupled respectively tothe signal lines 14 and the first shorting bar 301, the second shortingbar 302 and the third shorting bar 303. Both ends of the switches 41 andthe shorting bar group 30 (the first shorting bar 301, the secondshorting bar 302 and the third shorting bar 303) are belong to twodifferent metal layers, and an insulation layer is disposed therebetween(not shown for clarity) for protection. Thus, one end of the switches 41is electrically coupled to the first shorting bar 301, the secondshorting bar 302 and the third shorting bar 303 through a bonding pad 38(Jumper Layer) to penetrate the insulation layer.

Referring to FIG. 7, each of the switches (i.e., TFTs) 41 includes agate pattern 43, a source line 45 and a drain line 47. For instance, thegate pattern 43, the source line 44 and the drain line 47 arerespectively a gate, a source and a drain of the TFT switches. It shouldbe noted that the gate pattern 43 of each of the switches 41 areelectrically coupled with each other as shown in FIG. 4, and the gatepatterns 43 are electrically coupled to the scan line driver chip 22 asshown in FIG. 2. During the cell test process, an external inspectionapparatus output a high voltage (Vgh) signal to the gate patterns 43 ofthe switches 41, making the source lines 45 and the drain lines 47 ofthe switches 41 conduct. When switches 41 is conducted, the test signalscan be transmitted to the signal lines 14 via the first shorting bar301, the second shorting bar 302 and the third shorting bar 303 forinspection.

Referring to FIG. 7, the gate pattern 43 is disposed on the substrate10. The difference from the first embodiment is that the gate pattern 43is a face electrode, and the gate pattern 43 of each of the switches 41is electrically coupled with each other, that is, shares the same gate.The source line 45 is disposed on the gate pattern 43, and theinsulation layer (not shown) which is disposed between the source line45 and gate pattern 43 thereby serves as an insulator between the gateand the source of the TFT switch. One end of the source line 45 iselectrically coupled to one of the signal lines 14 (not shown). Thedrain line 47 is disposed on the gate pattern 43, also the insulationlayer (not shown) which is disposed between the drain line 47 and gatepattern 43 thereby serving as an insulator between the gate and thedrain of the TFT switch. One end of the drain line 47 is electricallycoupled to the shorting bar group 30 via a connection 39. Furthermore,the source line 45 and the drain line 47 are designed as comb shapes toincrease a W/L ratio of a transistor (W is designated as a channel widthof the transistor, and L is designated as a channel length of thetransistor) for benefiting the conduction of the switch 41.

The display panel of the second embodiment of the present inventionfurther includes a plurality of auxiliary repair lines 62. Both ends ofeach of the auxiliary repair lines 62 overlap one of a plurality ofconnections 39 between the switches 41 and the shorting bar group 30. Aninsulation layer (not shown) is disposed between the auxiliary repairlines 62 and the connections 39.

The source lines 45 of the switches 41, the drain lines 47 and thesignal lines 14 are made of same metal material; for example, they areformed in the same manufacturing process in array process of the LCDpanel. Similarly, the shorting bar group 30, the auxiliary repair lines62 and the gate patterns 43 of the switches 41 are made of same metalmaterial; for example, they are formed in the same manufacturing processin array process of the LCD panel. Therefore, it is not required toincrease additional manufacturing processes.

The method for repairing the signal lines of the display panel in thesecond preferred embodiment of the present invention will be explainedin detail in the following. Please continue to refer to FIG. 7, in thesecond preferred embodiment, the method for repairing the signal linesis aimed at the auxiliary repair line 62 which corresponds to thedamaged signal line 14. The method for repairing the signal lines 14includes a cutting process and a welding process.

The cutting process is by breaking off each of the connections 39between the switches 41 and the shorting bar group 30. The weldingprocess is welding both ends of one of the auxiliary repair lines 62which correspond to the damaged signal line 14 with both sides of theconnection 39 between the switch 41 and the shorting bar group 30 whichcorrespond to the damaged signal line 14.

It should be noted that the cutting process requires cutting each of theconnections 39 between each of the switches 41 and the shorting bargroup 30. In addition, the welding process only requires welding bothends of one of the auxiliary repair lines 62 which correspond to thedamaged signal line 14 into both sides of the connection 39, which makesthe drain line 47 to electrically couple to the shorting bar group 30,such as second shorting bar 302. The cutting process can be implementedvia a laser cutting along the dotted lines. The welding process can beimplemented via a laser welding at the welding spots 51, thereby makingboth ends of the auxiliary repair line 62 penetrate the insulation layerto electrically couple to the connection 39.

A display signal 23 of the damaged signal line 14 given off from thesignal line driving chip 24 is transmitted to the damaged signal line 14via the second shorting bar 302, the auxiliary repair line 62 and theswitch 41 which correspond to the damaged signal line 14. Meanwhile, thesignal line driving chip 24 provides a high voltage (Vgh) signal to thegate patterns 43, so that the switch 41 which corresponds to the damagedsignal line 14 is in an on-state. Furthermore, the display signal 23 canbe send to the damaged signal line 14 via the second shorting bar 302for repairing.

As mentioned above, in the display panel of the second preferredembodiment of the present invention, the structures of the auxiliaryrepair lines 62 are utilized in the circuit route of simplifiedlighting, so that each of the connections 39 can be cut off during theprocess of repairing and both ends of one of the auxiliary repair lines62 which correspond to the damaged signal line 14 can be welded intoboth sides of the connection 39. Therefore, the problem that the repairline needs to be disposed on the periphery area of the substrate hasbeen solved, and the available periphery area of the substrate is alsoincreased.

It should be noted that the present invention does not be limited theimplementation without the repair line, and it also can be implementedwith the repair line. More specifically, the repair line 16 (as shown inFIG. 1) can be designed to cross the shorting bar group 30 in aninsulated manner. When it requires to be repaired, the above-mentionedwelding process (such as laser welding) is performed at theintersections between the repair line 16, the signal lines 14 and theshorting bar group 30, so that the display signal 23, which providedfrom the signal line driving chip 24, is transmitted to the damagedsignal line 14 by the repair line 16 and the shorting bar group 30.

The following will explain an display panel according to a thirdpreferred embodiment of the present invention in detail with drawings.In the third preferred embodiment, the repair line 16 is completelyabandoned in the display panel, thereby making the available area of theperiphery of the substrate maximum. Referring to FIG. 8, FIG. 8 is aschematic drawing illustrating a circuit of the display panel accordingto the third preferred embodiment of the present invention. Thedescriptions of the same elements in the first and second preferredembodiments have been explained as above mention, so we need not go intodetail herein.

In the third preferred embodiment, the display panel of the first andsecond preferred embodiment further includes a electrostatic shielding(ESD) circuit 70 disposed on the substrate 10. The ESD circuit 70 isnon-closed disposed on the periphery of the active area 11, and crossesthe scan lines 12 and the signal lines 14 in an insulated manner (i.e.,overlapping each other without electrical coupling). Whereas the ESDcircuit 70 is not limited to be disposed on the periphery of the activearea 11, it can be also disposed inside of the active area 11. The ESDcircuit 70 is utilized to avoid static electricity from damaging to thecircuits within the active area 11 or the TFT array (not shown forclarity). Specifically, a switch element is disposed between the ESDcircuit 70, each of scan lines 12, and each of signal lines 14, such asa high voltage trigger TFT 71 (depicted only between the ESD circuit 70and the signal lines 14). The gate terminals of the high voltage triggerTFTs 71 are electrically coupled to the ESD circuit 70, and the sourceand drain terminals of the high voltage trigger TFTs 71 are electricallycoupled to two adjacent signal lines 14 or two adjacent scan lines 12.The high voltage trigger TFTs 71 are utilized to guide excessive staticcurrent to surrounding the scan lines 12 or the signal lines 14, therebydecreasing the damage of the circuits within the active area 11 or theTFT array by the excessive current or voltage.

In the third preferred embodiment, the ESD circuit 70 crosses but isinsulated from the at least one shorting bar (such as said shorting bargroup 30), as shown in FIG. 8. Specifically, the ESD circuit 70 isdesigned to extend from the intersections with the scan lines 12 (on theleft of the active area 11), and crosses the shorting bar group 30 in aninsulated manner. A contact pad 31 is disposed on one end of eachshorting bar 30, and the contact pad 31 is utilized to receive externalsignals in cell test process.

The method for repairing the signal lines of the display panel in thethird preferred embodiment of the present invention will be explained indetail in the following. Referring to FIG. 8 again, when one of thesignal lines 14 is disconnected, the above-mentioned welding process(such as a laser welding) can be performed at the intersections betweenthe ESD circuit 70 and the signal lines 14, and the intersectionsbetween the ESD circuit 70 and the shorting bar 30 which corresponds tothe disconnected signal line 14. The display signals 23 (as shown in anarrow) provided from the signal line driver chips 24 transmits to thedisconnect signal line 14 through the ESD protection circuit 70 forrepairing the signals. Details of the repair are described in the firstand second embodiment, so we won't go into detail herein.

The following will explain an display panel according to a fourthpreferred embodiment of the present invention in detail with drawings.Similarly, in the fourth preferred embodiment, the repair line 16 iscompletely abandoned in the display panel, thereby making the availablearea of the periphery of the substrate maximum. Referring to FIG. 9,FIG. 9 is a schematic drawing illustrating a circuit of the displaypanel according to the fourth preferred embodiment of the presentinvention. The descriptions of the same elements in the first, secondand third preferred embodiments have been explained as above mention, sowe won't go into detail herein.

Specifically, the difference between the fourth embodiment and the thirdembodiment lies in that the ESD circuit 70 is designed so as to extendfrom the intersections with the signal lines 14 (on the top of theactive area 11), and crosses the shorting bar group 30 in an insulatedmanner, as shown in FIG. 9. In the other embodiments, the ESD circuit 70can be designed to cross but be insulated from the contact pads 31. Itshould be noted that the present invention is not intended to limit thepositions of the intersections between the ESD circuit 70 and the atleast one shorting bar, and it can be implemented as long as the ESDprotection circuit 70 overlaps each shorting bar. In the intersectionsbetween the ESD circuit 70 and the shorting bar group 30, an insulationlayer (not shown) is disposed between the ESD circuit 70 and theshorting bar group 30 for separating thereof. The ESD circuit 70 can bedisposed over or under the shorting bar group 30. Similarly, the methodfor repairing the signal lines of the display panel in the fourthpreferred embodiment of the present invention is the same as that of thethird preferred embodiment, so we won't go into detail herein.

As mentioned above, the ESD circuit is utilized to cross but beinsulated from said shorting bar group on the display panel of the thirdand fourth preferred embodiment. When it requires repairing, the laserwelding can be performed at the intersections without disposing therepair line on the periphery area of the substrate, and the availableperiphery area of the substrate is also increased.

While the preferred embodiments of the present invention have beenillustrated and described in detail, various modifications andalterations can be made by persons skilled in this art. The embodimentof the present invention is therefore described in an illustrative butnot restrictive sense. It is intended that the present invention shouldnot be limited to the particular forms as illustrated, and that allmodifications and alterations which maintain the spirit and realm of thepresent invention are within the scope as defined in the appendedclaims.

What is claimed is:
 1. A display panel, comprising: a substrate; aplurality of signal lines disposed on the substrate; at least oneshorting bar disposed on the substrate, corresponding to the signallines; a plurality of switches electrically coupled respectively to thesignal lines and the at least one shorting bar; a plurality of auxiliaryrepair lines, both ends of each of the auxiliary repair linesoverlapping one of a plurality of connections between the switches andthe at least one shorting bar; and an insulation layer disposed betweeneach of the auxiliary repair lines and each of the connections.
 2. Thedisplay panel of claim 1, wherein each of the switches comprises: a gatepattern disposed on the substrate; a source line disposed on the gatepattern, an insulation layer disposed between the source line and thegate pattern, one end of the source line electrically coupled to one ofthe signal lines; and a drain line disposed on the gate pattern, theinsulation layer disposed between the drain line and the gate pattern,one end of the drain line electrically coupled to the shorting bar. 3.The display panel of claim 2, wherein the source lines and the drainlines of the switches, and the signal lines are made of same metalmaterial.
 4. The display panel of claim 2, wherein the at least oneshorting bar, the auxiliary repair lines and the gate pattern of each ofthe switches are made of same metal material.
 5. The display panel ofclaim 1, wherein the switches comprise a plurality of thin filmtransistor switches, and each of the thin film transistor switches has agate, and the thin film transistor switches are connected in cascadewith each other through the gates thereof.
 6. The display panel of claim1, further comprising an electrostatic shielding circuit disposed on thesubstrate, wherein the electrostatic shielding circuit crosses but isinsulated from the at least one shorting bar.
 7. The display panel ofclaim 6, wherein the electrostatic shielding circuit crosses but isinsulated from the signal lines.